Pascal and Francis Bibliographic Databases

Help

Search results

Your search

au.\*:("ROCKE, M")

Results 1 to 1 of 1

  • Page / 1
Export

Selection :

  • and

Titanium nitride for antireflection control and hillock suppression on aluminum silicon metallizationROCKE, M; SCHNEEGANS, M.Journal of vacuum science and technology. B. Microelectronics processing and phenomena. 1988, Vol 6, Num 4, pp 1113-1115, issn 0734-211XArticle

  • Page / 1